Noncontact vibration analysis using innovative laser-based methodology

Santiago Noriega; Devdas Shetty; Tom A. Eppes; Jun Kondo

doi:10.1117/12.686273

19 October 2006 Noncontact vibration analysis using innovative laser-based methodology

Santiago Noriega, Devdas Shetty, Tom A. Eppes, Jun Kondo

Proceedings Volume 6375, Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems; 63750L (2006) https://doi.org/10.1117/12.686273
Event: Optics East 2006, 2006, Boston, Massachusetts, United States

Abstract

Vibration is a back and forth mechanical motion with a steady, uninterrupted rhythm about an equilibrium point. There are two types of vibration; natural (or free) and forced. Natural vibration occurs as the result of a disturbing force that is applied once and then removed. Forced vibration occurs as a result of a force applied repeatedly to a system. All machines have some amount of forced vibration. However, in some cases this vibration can cause damage to machinery. Understanding vibration is essential for any system that will be exposed to motion. Equipment such as strain gauges and piezoelectric accelerometers have been adequate in measuring vibration in the past; however, due to increased performance requirements and subsequent reductions in vibration, these methods are slowly being replaced by laserbased measurement systems. One reason for the slow transition is that part of the system in these methods must be mounted on the surface of the object being measured which can change the mass thus alter the frequency and mode shape of the vibrating object. At this time however, the high expenses to monitor precision vibration is a challenge, and there is a need for more cost-effective methods of vibration analysis. This paper outlines a lower cost laser-based method of measuring vibration with minimum surface contact.

Citation Download Citation

Santiago Noriega, Devdas Shetty, Tom A. Eppes, and Jun Kondo "Noncontact vibration analysis using innovative laser-based methodology", Proc. SPIE 6375, Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems, 63750L (19 October 2006); https://doi.org/10.1117/12.686273

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available