Phase fluorometry for semiconductor lifetime measurement

Alexander R. Albrecht; Ramesh B. Laghumavarapu; Babak Imangholi; Mansoor Sheik-Bahae; Kevin J. Malloy

doi:10.1117/12.710064

13 March 2007 Phase fluorometry for semiconductor lifetime measurement

Alexander R. Albrecht, Ramesh B. Laghumavarapu, Babak Imangholi, Mansoor Sheik-Bahae, Kevin J. Malloy

Proceedings Volume 6461, Laser Cooling of Solids; 646108 (2007) https://doi.org/10.1117/12.710064
Event: Lasers and Applications in Science and Engineering, 2007, San Jose, California, United States

Abstract

Understanding and quantifying nonradiative recombination is a critical factor for the successful laser cooling of semiconductors. The usual approach to measuring the nonradiative lifetime employs pulsed photoexcitation and monitors the luminescence decay via time-resolved photon counting. We present an alternative approach that employs phase fluorometry with a lock-in amplifier. A sinusoidally modulated diode laser is used for excitation. Lifetime data are extracted from the frequency dependent phase shift and amplitude response of the photolumi-nescence signal, detected by a photomultiplier tube. Samples studied include high quality AlGaAs/GaAs/AlGaAs and GaInP/GaAs/GaInP double heterostructures, grown by MBE and MOCVD. Data over a temperature range from 10 to 300 K is compared with results obtained in time-domain measurements.

Citation Download Citation

Alexander R. Albrecht, Ramesh B. Laghumavarapu, Babak Imangholi, Mansoor Sheik-Bahae, and Kevin J. Malloy "Phase fluorometry for semiconductor lifetime measurement", Proc. SPIE 6461, Laser Cooling of Solids, 646108 (13 March 2007); https://doi.org/10.1117/12.710064

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