Paper
3 March 2008 Design and test of an improved direct-injection readout circuit for IRFPA
Liang Xie, Xiaojuan Xia, Feifeng Sun
Author Affiliations +
Proceedings Volume 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection; 662125 (2008) https://doi.org/10.1117/12.790984
Event: International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007, 2007, Beijing, China
Abstract
This paper reports the design and test of an improved direct-injection readout circuit for infrared focal plane arrays (IRFPA). In this circuit, two selectable capacitors are added in the pixel to accommodate the wide range of illumination conditions. The circuit also supports image transposition (invert/revert). A 128×128 pixels readout circuit chip which uses this improved readout circuit structure has been fabricated. A simple test bench is established to verify the availability of the readout chip. The testing method and results are also presented in this paper. The testing results show the good performance of the readout chip.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liang Xie, Xiaojuan Xia, and Feifeng Sun "Design and test of an improved direct-injection readout circuit for IRFPA", Proc. SPIE 6621, International Symposium on Photoelectronic Detection and Imaging 2007: Photoelectronic Imaging and Detection, 662125 (3 March 2008); https://doi.org/10.1117/12.790984
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Cited by 1 scholarly publication.
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KEYWORDS
Capacitors

Staring arrays

Clocks

Amplifiers

Infrared imaging

Field effect transistors

Printed circuit board testing

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