Paper
17 September 2007 Measurement of attosecond XUV pulses generated with polarization gating by two-dimensional photoelectron spectroscopy
Author Affiliations +
Abstract
We report on our high speed camera designed for temporal characterization of attosecond pulses (1as =10-18s) generated with the polarization gating technique. The uniform external magnetic field applied on the time-of-flight spectrometer enlarges the acceptance angle (up to 65° for ~20-eV photoelectrons). By collecting two-dimensional momentum images of the photoelectrons, which are ejected by the XUV pulses and streaked directly by the co-propagating polarization gating electric field, we expect to derive the information about the XUV pulses. After the characterization of XUV pulses, the same setup can be used to study complex dynamics of electrons in atoms and molecules with time-resolved spectroscopy.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shambhu Ghimire, Ximao Feng, and Zenghu Chang "Measurement of attosecond XUV pulses generated with polarization gating by two-dimensional photoelectron spectroscopy", Proc. SPIE 6703, Ultrafast X-Ray Sources and Detectors, 67030F (17 September 2007); https://doi.org/10.1117/12.737580
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Polarization

Extreme ultraviolet

Electrons

Mirrors

Wave plates

Chemical species

Pulsed laser operation

RELATED CONTENT

Average power meter for laser radiation
Proceedings of SPIE (April 29 2016)
True zero-order crystal wave-plate made of ADP crystal
Proceedings of SPIE (May 10 2019)
Study of photoemission spectroscopy with polarized x-rays
Proceedings of SPIE (November 07 1994)
Extending fs pulse metrology to attosecond XUV pulses
Proceedings of SPIE (September 20 2004)

Back to Top