Paper
10 October 2007 Improved performance of thin film broadband antireflective coatings
Matthew Mishrikey, Arya Fallahi, Christian Hafner, Rüdiger Vahldieck
Author Affiliations +
Proceedings Volume 6717, Optomechatronic Micro/Nano Devices and Components III; 671702 (2007) https://doi.org/10.1117/12.754320
Event: International Symposium on Optomechatronic Technologies, 2007, Lausanne, Switzerland
Abstract
Antireflective coatings are useful for a range of applications, from minimizing the radar cross-section of stealth aircraft, to maximizing the efficiency of solar energy panels. New low-index nanorod thin films promise broadband, broad angle performance for such coatings. We demonstrate that a bandwidth increase from 38.5% to 113% is possible by using a simple evolutionary strategy to optimize the thin film material parameters. A two dimensional FDTD planewave periodic scattering approach is used to demonstrate additional performance increase by adding losses to a single layer. The same technique may be used for antireflective coatings for which no analytical solution exists, as is the case with dispersive, non-linear materials, special geometries, and coatings with metallic or ferromagnetic inclusions. A procedure is outlined for using the FDTD approach to obtain a map of reflection coefficients with respect to wavelength and incidence angle.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Matthew Mishrikey, Arya Fallahi, Christian Hafner, and Rüdiger Vahldieck "Improved performance of thin film broadband antireflective coatings", Proc. SPIE 6717, Optomechatronic Micro/Nano Devices and Components III, 671702 (10 October 2007); https://doi.org/10.1117/12.754320
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Thin film coatings

Finite-difference time-domain method

Reflectivity

Antireflective coatings

Thin films

Reflection

Nanorods

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