Paper
27 November 2007 Study on automatic measurement of tiny-size
Shijun Wang, Pingan Mu, Shuguang Dai, Weiwei Liu
Author Affiliations +
Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 67232E (2007) https://doi.org/10.1117/12.783302
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China
Abstract
The computer vision technology is applied into automatic measurement of tiny-size like filament. The authors utilize digit image processing technology to analyze and research image data, extract edge contour of objects, consequently obtain information including edge position and dimension of objects. The information can be used to obtain practical dimension of objects after being calibrated and analyze objects' parameters and find out eligible objects.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shijun Wang, Pingan Mu, Shuguang Dai, and Weiwei Liu "Study on automatic measurement of tiny-size", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 67232E (27 November 2007); https://doi.org/10.1117/12.783302
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Cited by 1 scholarly publication.
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KEYWORDS
Image processing

Electrodes

Binary data

Analytical research

Calibration

Optical inspection

Computing systems

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