Paper
1 August 2007 Radio frequency magnetron sputtering deposition of borate and phosphate glass films
Lucica Boroica, I. Boroica, E. Rotiu, B. Sava, R. Medianu, Clementina Timus, Dagmar Hülsenberg
Author Affiliations +
Proceedings Volume 6785, ROMOPTO 2006: Eighth Conference on Optics; 678524 (2007) https://doi.org/10.1117/12.756819
Event: ROMOPTO 2006: Eighth Conference on Optics, 2006, Sibiu, Romania
Abstract
There are different methods to obtain nanostructured thin films: chemical, physical, electrochemical, PLD and radio frequency deposition. The aim of this study was to establish the influence of the process parameters on the films structure and to improve the technological parameters. B2O3 and P2O5 vitreous targets have been obtained to be used as targets for r.f. magnetron sputtering. To obtain high quality targets it is necessary to use p.a. purity reagents which are dry mixed, then melt for 2 hours at 1200-1250°C. The melted mixture is poured in the mould. The vitreous materials are characterized by DTA, chemical analysis and x-ray diffraction to check for stoichiometry. The thin films obtained by r.f. magnetron sputtering have been characterized by AFM and SEM. The thickness of the composite films are "in situ" controlled in the range (2-20) nm. It seems that these films could be used as space layers in magnetoresistive superlattices, in spite these are totally amorphous without separations.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lucica Boroica, I. Boroica, E. Rotiu, B. Sava, R. Medianu, Clementina Timus, and Dagmar Hülsenberg "Radio frequency magnetron sputtering deposition of borate and phosphate glass films", Proc. SPIE 6785, ROMOPTO 2006: Eighth Conference on Optics, 678524 (1 August 2007); https://doi.org/10.1117/12.756819
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Glasses

Sputter deposition

Atomic force microscopy

Thin films

Vitreous

Crystals

Silicon

Back to Top