Paper
28 January 2008 Reflectance model for color halftone prints
Author Affiliations +
Proceedings Volume 6807, Color Imaging XIII: Processing, Hardcopy, and Applications; 680718 (2008) https://doi.org/10.1117/12.754643
Event: Electronic Imaging, 2008, San Jose, California, United States
Abstract
The scattering of light within paper and the ink penetration in the substrate are the key factors which affect the color reproduction. A reflectance model for color halftone prints is introduced in this paper which considers these factors. The model is obtained by the extended Murray-Davies model and iterative algorithm. The model described in this paper contains two parameters, n and v . The n factor equals to the sum of w and v . The w factor relates to the optical spread function of paper relative to the spatial frequency of the halftone dots. The v factor relates to the distribution of colorant within the dots. The value of n and v are obtained by simulation according to the experimental data. For offset lithographic halftone data at 150lpi, the value of n and v are 1.578 and 0.02, thermal wax transfer halftone ( n =2.292, v =0.0209) and stochastic halftone ( n =1.1853, v =-0.006).
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Yixin Zhang, Jinghuan Ge, and Dongjuan Zang "Reflectance model for color halftone prints", Proc. SPIE 6807, Color Imaging XIII: Processing, Hardcopy, and Applications, 680718 (28 January 2008); https://doi.org/10.1117/12.754643
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KEYWORDS
Halftones

Reflectivity

Data modeling

Light scattering

Reflection

Lithography

Stochastic processes

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