A transmitted terahertz emission microscopy

Yu-Ping Yang; Wei Yan; Li Wang

doi:10.1117/12.758808

4 January 2008 A transmitted terahertz emission microscopy

Yu-Ping Yang, Wei Yan, Li Wang

Proceedings Volume 6840, Terahertz Photonics; 68400G (2008) https://doi.org/10.1117/12.758808
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

A novel transmitted terahertz-emission microscopy (TTEM) is proposed and developed for improving the spatial resolution of THz imaging. An epitaxial GaAs film grown on the GaP substrate was used as THz emitter; the transmitted THz signal was collected and detected by a ZnTe electric-optical crystal. Because the thick of GaAs layer is merely 1 μm, the THz wave source has the same size of the excited point. While attaching a sample directly onto the emitter, the spatial resolution is decided by the diameter of focused pump beam, which can be achieved a few micrometers and tunable. In addition, it can avoid the loss of the spectral components. By means of the near-field detection, the intensity, spatial resolution and bandwidth of THz signal in this system can be enhanced further. The configuration and characteristics of this microscopy are described in detail.

Citation Download Citation

Yu-Ping Yang, Wei Yan, and Li Wang "A transmitted terahertz emission microscopy", Proc. SPIE 6840, Terahertz Photonics, 68400G (4 January 2008); https://doi.org/10.1117/12.758808

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