Paper
11 March 2008 The structure and dielectrics of epitaxially strained BaRO3(R=Ti, Zr) thin films
Jinlong Tang, Jun Zhu, Jie Xiong, Wenfeng Qin, Yanrong Li
Author Affiliations +
Proceedings Volume 6984, Sixth International Conference on Thin Film Physics and Applications; 698402 (2008) https://doi.org/10.1117/12.792149
Event: Sixth International Conference on Thin Film Physics and Applications, 2007, Shanghai, China
Abstract
The structure and static dielectric permittivity of BaRO3(R=Ti, Zr) thin films as a function of epitaxial strain are determined by using first-principle density functional theory calculation based on pseudopotentials and a plane-wave basis. It is found that BaTiO3 thin films under compressive misfit strain can be grown more easily than those under tensile misfit strain, while thin films of BaZrO3 can be grown more easily under tensile strain. The static dielectric permittivity of BaTiO3 thin films under different misfit strain is obtained by calculating optical phonon frequencies and Born effective charges using density functional perturbation theory. The zero-temperature dielectric permittivity of ε33 increases to the maximal value under compressive misfit strain, while the ε11/22 reaches to its maximal value under tensile misfit strain. For BaZrO3 thin films, the dielectric permittivity εr changes little. However, εr exhibits non-linear characteristics under tensile strain, which reaches to the maximal value under misfit strain of ~1%. This unsymmetrical dielectric behavior caused by strain is attributed to soften phonons in BaTiO3 or BaZrO3 thin films.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jinlong Tang, Jun Zhu, Jie Xiong, Wenfeng Qin, and Yanrong Li "The structure and dielectrics of epitaxially strained BaRO3(R=Ti, Zr) thin films", Proc. SPIE 6984, Sixth International Conference on Thin Film Physics and Applications, 698402 (11 March 2008); https://doi.org/10.1117/12.792149
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KEYWORDS
Thin films

Dielectrics

Phonons

Zirconium

Ferroelectric materials

Distortion

Ions

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