Defect measurements of CdZnTe detectors using I-DLTS, TCT, I-V, C-V and gamma-ray spectroscopy

R. Gul; Z. Li; R. Rodriguez; K. Keeter; A. Bolotnikov; R. James

doi:10.1117/12.797865

4 September 2008 Defect measurements of CdZnTe detectors using I-DLTS, TCT, I-V, C-V and γ-ray spectroscopy

R. Gul, Z. Li, R. Rodriguez, K. Keeter, A. Bolotnikov, R. James

Proceedings Volume 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X; 70790U (2008) https://doi.org/10.1117/12.797865
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

In this work we measured the crystal defect levels and tested the performance of CdZnTe detectors by diverse methodologies, viz., Current Deep Level Transient Spectroscopy (I-DLTS), Transient Current Technique (TCT), Current and Capacitance versus Voltage measurements (I-V and C-V), and gamma-ray spectroscopy. Two important characteristics of I-DLTS technique for advancing this research are (1) it is applicable for high-resistivity materials (>10⁶ Ω-cm), and, (2) the minimum temperature for measurements can be as low as 10 K. Such low-temperature capability is excellent for obtaining measurements at shallow levels. We acquired CdZnTe crystals grown by different techniques from two different vendors and characterized them for point defects and their response to photons. I-DLTS studies encompassed measuring the parameters of the defects, such as the energy levels in the band gap, the carrier capture cross-sections and their densities. The current induced by the laser-generated carriers and the charge collected (or number of electrons collected) were obtained using TCT that also provides the transport properties, such as the carrier life time and mobility of the detectors under study. The detector's electrical characteristics were explored, and its performance tested using I-V, C-V and gamma-ray spectroscopy.

Citation Download Citation

R. Gul, Z. Li, R. Rodriguez, K. Keeter, A. Bolotnikov, and R. James "Defect measurements of CdZnTe detectors using I-DLTS, TCT, I-V, C-V and γ-ray spectroscopy", Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 70790U (4 September 2008); https://doi.org/10.1117/12.797865

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available