Paper
25 September 2008 Finish assessment of complex surfaces by advanced light scattering techniques
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Abstract
The tremendous development of optical technologies and new manufacturing methods places challenging demands on metrology. Tools are required which allow for a rapid and sensitive inspection of the quality and homogeneity of surface finish even on large and curved surfaces. Light scattering measurements are best suited to meet these requirements. Recently developed instruments for scatter measurements at various wavelengths are presented in this paper. Examples of application are presented for diamond-turned and polished surfaces as well as for supersmooth EUV mirrors. In addition to laboratory-based instruments, compact and table-top tools currently being developed are briefly presented.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sven Schröder and Angela Duparré "Finish assessment of complex surfaces by advanced light scattering techniques", Proc. SPIE 7102, Optical Fabrication, Testing, and Metrology III, 71020F (25 September 2008); https://doi.org/10.1117/12.797964
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CITATIONS
Cited by 6 scholarly publications.
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KEYWORDS
Light scattering

Scattering

Scatter measurement

Surface finishing

Mirrors

Extreme ultraviolet

Polishing

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