Paper
7 January 2009 Pulse compression gratings for the PETAL project: a review of various technologies
Jérôme Néauport, Nicolas Bonod
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Abstract
A Petawatt facility called PETAL (PETawatt Aquitaine Laser) is under development near the LIL (Ligne d'Integration Laser) at CEA Cesta, France. PETAL facility uses chirped pulse amplification (CPA) technique. We herein review various studies made to develop pulse compression gratings for CPA application with high laser induced damaged threshold. Different multilayer dielectric (MLD) gratings have been manufactured to exhibit different electric field maximum values in the pillars of the grating. A damage testing facility operating at 1.053μm, 500fs pulse duration is used to damage test the parts manufactured from these designs. It is evidenced that for fixed incidence and materials the damage of the grating is directly related to the electric field intensity maximum in the material, which depends on the groove profile. Laser induced damage thresholds of 5 J/ cm2 is experimentally reached with very high and uniform efficiencies. New structures are currently under study, gratings with mixed metal/dielectric layers MLD or more exotic 2D and 3D photonic crystals devices. For each case, we detail the design and expected performances. We also give some diffraction efficiency and laser damage measurements when samples were manufactured.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jérôme Néauport and Nicolas Bonod "Pulse compression gratings for the PETAL project: a review of various technologies", Proc. SPIE 7132, Laser-Induced Damage in Optical Materials: 2008, 71320D (7 January 2009); https://doi.org/10.1117/12.804413
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Cited by 6 scholarly publications.
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KEYWORDS
Manufacturing

Laser damage threshold

Photonic crystals

Diffraction gratings

Laser induced damage

Silica

Mirrors

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