Paper
12 January 2009 Quartz tuning fork temperature sensor testing system based on programmable chip
Jun Xu, Bo You, Lihua Hu, Jing Ma, Xin Li
Author Affiliations +
Proceedings Volume 7133, Fifth International Symposium on Instrumentation Science and Technology; 71331F (2009) https://doi.org/10.1117/12.807894
Event: International Symposium on Instrumentation Science and Technology, 2008, Shenyang, China
Abstract
A digital temperature testing system has been developed using a programmable chip for a ZY cutting-type quartz tuning fork temperature sensor. The system consists of hardware and software functionalities and it is implemented on an Altera Cyclone II EP2C35 Field Programmable Gate Array including a NIOS core processor. To satisfy the real time processing constraints on the one hand, and parameterization on the other hand, part of the algorithm are implemented in hardware and others are implemented in software. Experimental results indicate that the testing system can be used to measure the temperature with an accuracy of 0.01 degree C, and the effective resolution is better than 0.003 degree C in the range of - 20 degree C to 140 degree C.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jun Xu, Bo You, Lihua Hu, Jing Ma, and Xin Li "Quartz tuning fork temperature sensor testing system based on programmable chip", Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71331F (12 January 2009); https://doi.org/10.1117/12.807894
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