Refractive-index sensor incorporating a polymeric waveguide overlaid with TiO2 thin films

Geun-Sik Son; Soon-Woo Kwon; Woo-Kyung Kim; Woo-Seok Yang; Hyung-Man Lee; Han-Young Lee; Sung-Dong Lee; Sang-Shin Lee

doi:10.1117/12.808860

9 February 2009 Refractive-index sensor incorporating a polymeric waveguide overlaid with TiO₂ thin films

Geun-Sik Son, Soon-Woo Kwon, Woo-Kyung Kim, Woo-Seok Yang, Hyung-Man Lee, Han-Young Lee, Sung-Dong Lee, Sang-Shin Lee

Proceedings Volume 7218, Integrated Optics: Devices, Materials, and Technologies XIII; 721818 (2009) https://doi.org/10.1117/12.808860
Event: SPIE OPTO: Integrated Optoelectronic Devices, 2009, San Jose, California, United States

Abstract

A refractive index sensor based on a three-layered polymeric waveguide was proposed and demonstrated. A high-index thin film in TiO₂ was placed on top of the waveguide in the sensing region, playing the role of strengthening the evanescent field to enhance the sensitivity of the sensor. The refractive index of the analyte applied to the surface of the sensor was estimated by observing the count of the polarimetric interference between the TE and TM polarizations, which is manifested as a periodic variation in the optical output of the sensor. For a fabricated sensor involving a 20 nm thick TiO₂ film, the sensitivity was found to be equivalent to 1.8x10^-3 RIU. It was found to be enhanced by increasing the thickness of the high-index overlay to a certain degree.

Citation Download Citation

Geun-Sik Son, Soon-Woo Kwon, Woo-Kyung Kim, Woo-Seok Yang, Hyung-Man Lee, Han-Young Lee, Sung-Dong Lee, and Sang-Shin Lee "Refractive-index sensor incorporating a polymeric waveguide overlaid with TiO₂ thin films", Proc. SPIE 7218, Integrated Optics: Devices, Materials, and Technologies XIII, 721818 (9 February 2009); https://doi.org/10.1117/12.808860

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