Compositional dependence of absorption edges in evaporated Pb1-xGeTe thin films as infrared short-wavelength cutoff filters

Bin Li; Suying Zhang; Ping Xie; Dingquan Liu

doi:10.1117/12.830991

20 May 2009 Compositional dependence of absorption edges in evaporated Pb_1-xGeTe thin films as infrared short-wavelength cutoff filters

Bin Li, Suying Zhang, Ping Xie, Dingquan Liu

Author Affiliations +

Proceedings Volume 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 72822L (2009) https://doi.org/10.1117/12.830991
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

Semiconductors which exhibit a very rapid transition from opacity to transparency at the intrinsic edge are particularly useful in making excellent absorption filters. In this paper, we report the investigation on composition dependence of absorption edges in the evaporated Pb1-xGexTe thin films, which will be of a potentiality to fabricate a single-layer infrared short-wavelength cutoff filter by means of controlling the composition and processes. It is revealed that for thin films with an identical Te concentration, the absorption edges will shift towards short-wavelength with the increase of Ge concentration x in films; whereas, for those with a similar Ge concentration within a small range of deviation, the edges will also shift towards the short-wavelength with Te concentration approach to stoichiometry.ÿÿ

Citation Download Citation

Bin Li, Suying Zhang, Ping Xie, and Dingquan Liu "Compositional dependence of absorption edges in evaporated Pb_1-xGeTe thin films as infrared short-wavelength cutoff filters", Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 72822L (20 May 2009); https://doi.org/10.1117/12.830991

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