Imaging characterization and tolerance analysis of thin planar photon sieves

Zhifeng Chen; Chinhua Wang; Hong Qu

doi:10.1117/12.832077

18 May 2009 Imaging characterization and tolerance analysis of thin planar photon sieves

Zhifeng Chen, Chinhua Wang, Hong Qu

Proceedings Volume 7284, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems; 72840J (2009) https://doi.org/10.1117/12.832077
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

The effects of various design and fabrication parameters on the imaging characteristics of a photon sieve are analyzed. Specifically, the focusing characteristics on the focal plane of photon sieves with different arrangement of pinholes in terms of shape, orientation and angle of incidence were investigated using professional optical design software ZEMAX for the first time, which is otherwise difficult to calculate by the exact theory. The fabrication tolerances of different parameters of the photon sieves were evaluated using Monte-Carlo method.

Citation Download Citation

Zhifeng Chen, Chinhua Wang, and Hong Qu "Imaging characterization and tolerance analysis of thin planar photon sieves", Proc. SPIE 7284, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems, 72840J (18 May 2009); https://doi.org/10.1117/12.832077

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