Femtosecond time-resolved differential reflectively measurements in Ga1-xMnxAs epitaxial thin films

G. P. Pepe; C. de Lisio; L. Parlato; V. Pagliarulo; N. Marrocco; C. Zhao; V. Novak; K. Olejnik; M. Cukr; Roman Sobolewski

doi:10.1117/12.823838

19 May 2009 Femtosecond time-resolved differential reflectively measurements in Ga_1-xMn_xAs epitaxial thin films

G. P. Pepe, C. de Lisio, L. Parlato, V. Pagliarulo, N. Marrocco, C. Zhao, V. Novak, K. Olejnik, M. Cukr, Roman Sobolewski

Author Affiliations +

Proceedings Volume 7354, Nonlinear Optics and Applications III; 735411 (2009) https://doi.org/10.1117/12.823838
Event: SPIE Optics + Optoelectronics, 2009, Prague, Czech Republic

Abstract

Magnetic semiconductors such as Ga_1-xMn_xAs have attracted a great interest in the last years due to their high potential as advanced-performance materials in optical detection and in novel spintronic devices. The carrier dynamics and the nonlinear optical response in low-temperature-grown GaAs/Ga_1-xMn_xAs heterostructures represent an interesting topic much less explored than their electronic transport and/or structural studies. We report our optical investigations of Ga_1-xMn_xAs films, grown with different Mn concentrations and subject to annealing conditions, by time-resolved, femtosecond pump-probe, differential reflectivity measurements. The analysis of the carrier relaxation times at low temperatures is presented and discussed according to nonequilibrium theories for electron scattering in magnetic materials.

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G. P. Pepe, C. de Lisio, L. Parlato, V. Pagliarulo, N. Marrocco, C. Zhao, V. Novak, K. Olejnik, M. Cukr, and Roman Sobolewski "Femtosecond time-resolved differential reflectively measurements in Ga_1-xMn_xAs epitaxial thin films", Proc. SPIE 7354, Nonlinear Optics and Applications III, 735411 (19 May 2009); https://doi.org/10.1117/12.823838

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