Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs, and performances

July A. Galeano Zea; Patrick Sandoz

doi:10.1117/12.827485

17 June 2009 Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs, and performances

July A. Galeano Zea, Patrick Sandoz

Author Affiliations +

Proceedings Volume 7389, Optical Measurement Systems for Industrial Inspection VI; 73891N (2009) https://doi.org/10.1117/12.827485
Event: SPIE Europe Optical Metrology, 2009, Munich, Germany

Abstract

A vision system is used for measuring in-plane target displacement, position and orientation. Pseudo-periodic patterns fixed on the target forms a phase reference. Absolute position is determined with subpixel accuracy by phase computations. Various position encoding designs are proposed for different displacement ranges and resolution. Performances obtained are compared and discussed for both displacement and orientation measurements. The capability to resolve position on depth ranges larger than the lens depth of focus is demonstrated.

Citation Download Citation

July A. Galeano Zea and Patrick Sandoz "Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs, and performances", Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73891N (17 June 2009); https://doi.org/10.1117/12.827485

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