Using holographic optical tweezers to measure forces with SPM-like probes

J. A. Grieve; D. M. Carberry; L. Ikin; G. M. Gibson; M. J. Padgett; M. J. Miles

doi:10.1117/12.826027

28 August 2009 Using holographic optical tweezers to measure forces with SPM-like probes

J. A. Grieve, D. M. Carberry, L. Ikin, G. M. Gibson, M. J. Padgett, M. J. Miles

Proceedings Volume 7400, Optical Trapping and Optical Micromanipulation VI; 74001X (2009) https://doi.org/10.1117/12.826027
Event: SPIE NanoScience + Engineering, 2009, San Diego, California, United States

Abstract

Holographic optical tweezers are used to assemble and control probes made from high aspect-ratio CdS and SiO₂ nanorods and SiO₂ microspheres. Analysis of the probe position allows for the measurement of forces experienced by the tip in a manner analogous to existing scanning probe microscopy (SPM) techniques.

Citation Download Citation

J. A. Grieve, D. M. Carberry, L. Ikin, G. M. Gibson, M. J. Padgett, and M. J. Miles "Using holographic optical tweezers to measure forces with SPM-like probes", Proc. SPIE 7400, Optical Trapping and Optical Micromanipulation VI, 74001X (28 August 2009); https://doi.org/10.1117/12.826027

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