"Stabilizing Laser Frequencies For Metrology Applications"

John C. Tsai

doi:10.1117/12.939752

10 April 1987 "Stabilizing Laser Frequencies For Metrology Applications"

John C. Tsai

Proceedings Volume 0741, Design of Optical Systems Incorporating Low Power Lasers; (1987) https://doi.org/10.1117/12.939752
Event: OE LASE'87 and EO Imaging Symposium, 1987, Los Angeles, CA, United States

Abstract

Frequency stability plays a crucial role for laser metrological applications. This paper first reviews the laser as a measurement tool in metrology. The techniques of laser frequency stabilization for metrological applications are then discussed from physical and engineering points of view. Finally, an example of recent advance in laser frequency stabilization is presented.

Citation Download Citation

John C. Tsai ""Stabilizing Laser Frequencies For Metrology Applications"", Proc. SPIE 0741, Design of Optical Systems Incorporating Low Power Lasers, (10 April 1987); https://doi.org/10.1117/12.939752

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