Computation of crack tip elastic strain intensity factor in mode I by electronic speckle pattern interferometry

Jorge Parra Michel; Amalia Martínez; J. A. Rayas

doi:10.1117/12.824393

10 September 2009 Computation of crack tip elastic strain intensity factor in mode I by electronic speckle pattern interferometry

Jorge Parra Michel, Amalia Martínez, J. A. Rayas

Author Affiliations +

Proceedings Volume 7432, Optical Inspection and Metrology for Non-Optics Industries; 74321B (2009) https://doi.org/10.1117/12.824393
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

In this work, a dual illumination beam system is used to obtain the strain intensity factor in mode one (mode I) to mechanical elements during tension testing. The displacement field is obtained by means of a phase stepping technique, and deformations are calculated by the Stokes differentiation method. Results are compared using a finite element analysis technique.

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Jorge Parra Michel, Amalia Martínez, and J. A. Rayas "Computation of crack tip elastic strain intensity factor in mode I by electronic speckle pattern interferometry", Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 74321B (10 September 2009); https://doi.org/10.1117/12.824393

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