Far-IR reflectance spectra analysis of CdZnTe and related materials

Tzuen-Rong Yang; Sheng-Hong Jhang; Yen-Hao Shih; Fu-Chung Hou; Yu-Chang Yang; P. Becla; Der-Chi Tien; Zhe Chuan Feng

doi:10.1117/12.825874

11 September 2009 Far-IR reflectance spectra analysis of CdZnTe and related materials

Tzuen-Rong Yang, Sheng-Hong Jhang, Yen-Hao Shih, Fu-Chung Hou, Yu-Chang Yang, P. Becla, Der-Chi Tien, Zhe Chuan Feng

Proceedings Volume 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI; 74490L (2009) https://doi.org/10.1117/12.825874
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

Far-infrared (FIR) reflectance spectroscopy has been employed to study the optical properties for a series of bulk CdZnxTe1-x and CdSexTe1-x wafers. The zone-centre optical phonons for the ternary alloys show a variety of behavior patterns: they exhibit a "one-mode", "two-mode" or "intermediate-mode" behavior depending on the vibration characteristics of the end binary members. The CdSeTe called CST were found to be single-crystal with the zincblende structure. These four samples labeled with CST5, CST15, CST25, and CST35, which correspond with the composition of Se, 5%, 15%, 25%, 35%, respectively. The intensity of CdTe-like TO band decays with x increasing, and the peak position increases from 140 cm^-1 to 145 cm^-1. In the other hand, the intensity of CdSe-like TO band grows with x increasing, and the peak position of CdSe-like TO band increases from 174 cm^-1 to 181 cm-1. We use the model of dielectric function and using Least-Square fit to find the optical and transport parameters. By the infrared spectra analysis, we found the conductivity of CdZn_xTe_1-x increase with increasing of x value and the conductivity of CdSe_xTe_1-x decrease with increasing of x value.

Citation Download Citation

Tzuen-Rong Yang, Sheng-Hong Jhang, Yen-Hao Shih, Fu-Chung Hou, Yu-Chang Yang, P. Becla, Der-Chi Tien, and Zhe Chuan Feng "Far-IR reflectance spectra analysis of CdZnTe and related materials", Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74490L (11 September 2009); https://doi.org/10.1117/12.825874

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