Research and application on imaging technology of line structure light based on confocal microscopy

Wenfeng Han; Zexin Xiao; Xiaofen Wang

doi:10.1117/12.837804

30 November 2009 Research and application on imaging technology of line structure light based on confocal microscopy

Wenfeng Han, Zexin Xiao, Xiaofen Wang

Proceedings Volume 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments; 75061P (2009) https://doi.org/10.1117/12.837804
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

In 2005, the theory of line structure light confocal microscopy was put forward firstly in China by Xingyu Gao and Zexin Xiao in the Institute of Opt-mechatronics of Guilin University of Electronic Technology. Though the lateral resolution of line confocal microscopy can only reach or approach the level of the traditional dot confocal microscopy. But compared with traditional dot confocal microscopy, it has two advantages: first, by substituting line scanning for dot scanning, plane imaging only performs one-dimensional scanning, with imaging velocity greatly improved and scanning mechanism simplified, second, transfer quantity of light is greatly improved by substituting detection hairline for detection pinhole, and low illumination CCD is used directly to collect images instead of photoelectric intensifier. In order to apply the line confocal microscopy to practical system, based on the further research on the theory of the line confocal microscopy, imaging technology of line structure light is put forward on condition of implementation of confocal microscopy. Its validity and reliability are also verified by experiments.

Citation Download Citation

Wenfeng Han, Zexin Xiao, and Xiaofen Wang "Research and application on imaging technology of line structure light based on confocal microscopy", Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 75061P (30 November 2009); https://doi.org/10.1117/12.837804

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