Ray tracing in biaxial materials

Wai Sze T. Lam; Stephen McClain; Greg A. Smith; Russell Chipman

doi:10.1117/12.868343

9 September 2010 Ray tracing in biaxial materials

Wai Sze T. Lam, Stephen McClain, Greg A. Smith, Russell Chipman

Proceedings Volume 7652, International Optical Design Conference 2010; 76521R (2010) https://doi.org/10.1117/12.868343
Event: International Optical Design Conference 2010, 2010, Jackson Hole, WY, United States

Abstract

Algorithms for polarization ray tracing biaxial materials and calculating the directions of ray propagation and energy flow, the refractive indices, and the coupling coefficients for all four resultant reflected and transmitted rays are presented. Examples of polarization state maps, retardance maps and diattenuation maps are generated as a function of angle of incidence for comparing plane parallel plate systems with uniaxial and biaxial materials.

Citation Download Citation

Wai Sze T. Lam, Stephen McClain, Greg A. Smith, and Russell Chipman "Ray tracing in biaxial materials", Proc. SPIE 7652, International Optical Design Conference 2010, 76521R (9 September 2010); https://doi.org/10.1117/12.868343

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