Measurement system for FT-IR infrared spectral emissivity of solid surface at ultra-high temperature

Zongwei Wang; Jingmin Dai

doi:10.1117/12.867521

11 October 2010 Measurement system for FT-IR infrared spectral emissivity of solid surface at ultra-high temperature

Zongwei Wang, Jingmin Dai

Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 76563Q (2010) https://doi.org/10.1117/12.867521
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

Taking account of the spectral radiation characteristics of materials in national defense, aerospace and other application areas, especially above 2000°C, we established a new ultra-high temperature spectral emissivity measurement system. The system covers 100~2400 °C temperature range and 2 ~ 25μm spectral range with background radiation compensation and gas control function. Fourier transform infrared (FTIR) spectroscopy collects spectrum signal with DTGS detector. We have tested the system non-linearity response, spectral response function and optical path consistency, and evaluated blackbody's effective emissivity. In order to objectively evaluate results of measurement system, we measured spectral emissivity of graphite and ultra-high temperature ceramic material ZrB₂-SiC, compared the results with literature's data and the agreement is obtained. Analyzed the factors that effects emissivity measurement results, the standard uncertainty of spectral emissivity at 10μ;m is less than 3%.

Citation Download Citation

Zongwei Wang and Jingmin Dai "Measurement system for FT-IR infrared spectral emissivity of solid surface at ultra-high temperature", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76563Q (11 October 2010); https://doi.org/10.1117/12.867521

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