Group delay measurement of 1.3 µm quantum dot semiconductor optical amplifier over 120 nm of spectral bandwidth

Marcus Bagnell; Josue Davila-Rodriguez; Abhijeet Ardey; Peter J. Delfyett

doi:10.1117/12.852732

16 April 2010 Group delay measurement of 1.3 μm quantum dot semiconductor optical amplifier over 120 nm of spectral bandwidth

Marcus Bagnell, Josue Davila-Rodriguez, Abhijeet Ardey, Peter J. Delfyett

Author Affiliations +

Proceedings Volume 7700, Enabling Photonics Technologies for Defense, Security, and Aerospace Applications VI; 77000G (2010) https://doi.org/10.1117/12.852732
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

This work presents group delay measurements for a 1.3 μm quantum dot semiconductor optical amplifier at various injection currents. White-light interferometry is used to obtain group delay data spanning both ground state and first excited state transitions, ranging from 1200 nm to 1320 nm. The group delay, group velocity dispersion and existence of higher order dispersion is observed and quantified.

Citation Download Citation

Marcus Bagnell, Josue Davila-Rodriguez, Abhijeet Ardey, and Peter J. Delfyett "Group delay measurement of 1.3 μm quantum dot semiconductor optical amplifier over 120 nm of spectral bandwidth", Proc. SPIE 7700, Enabling Photonics Technologies for Defense, Security, and Aerospace Applications VI, 77000G (16 April 2010); https://doi.org/10.1117/12.852732

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