Lateral distribution of the degradation of encapsulants after different damp-heat exposure times investigated by Raman spectroscopy

C. Peike; T. Kaltenbach; M. Köhl; K.-A. Weiß

doi:10.1117/12.860590

19 August 2010 Lateral distribution of the degradation of encapsulants after different damp-heat exposure times investigated by Raman spectroscopy

C. Peike, T. Kaltenbach, M. Köhl, K.-A. Weiß

Author Affiliations +

Proceedings Volume 7773, Reliability of Photovoltaic Cells, Modules, Components, and Systems III; 77730E (2010) https://doi.org/10.1117/12.860590
Event: SPIE Solar Energy + Technology, 2010, San Diego, California, United States

Abstract

PV modules have to have a service lifetime of more than 20 years. It is hard to follow suitable degradation indicators during service life testing with sufficient accuracy for reliable service life estimation. Often the polymeric encapsulation material, mostly ethylene vinyl acetate, shows degradation effects. The detection of small changes of the material in a non-destructive manner helps to follow the changes over time during indoor testing. PV modules with crystalline Si-cells of seven German manufacturers were analyzed after accelerated ageing tests with Raman spectroscopy. This technology allows non-destructive measurements of the encapsulation material through the glazing so that the degradation of the samples can be followed by measuring after different exposure times. Samples had been exposed to damp-heat conditions for up to 4000 h. The results show significant differences in the materials degradation above the edges and the center of the cell. With increasing exposure times, it becomes apparent that the degradation process starts near the edges of the cells and propagates towards the center, indicating the impact of diffusion processes.

Citation Download Citation

C. Peike, T. Kaltenbach, M. Köhl, and K.-A. Weiß "Lateral distribution of the degradation of encapsulants after different damp-heat exposure times investigated by Raman spectroscopy", Proc. SPIE 7773, Reliability of Photovoltaic Cells, Modules, Components, and Systems III, 77730E (19 August 2010); https://doi.org/10.1117/12.860590

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available