Beam coherence and x-ray windows

Ali Khounsary; Barry Lai; Jun Qian; Ruben Khachatryan; Jozef Maj; Xianrong Huang

doi:10.1117/12.877449

6 October 2010 Beam coherence and x-ray windows

Ali Khounsary, Barry Lai, Jun Qian, Ruben Khachatryan, Jozef Maj, Xianrong Huang

Proceedings Volume 7802, Advances in X-Ray/EUV Optics and Components V; 78020O (2010) https://doi.org/10.1117/12.877449
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

Beryllium windows are used on many X-ray synchrotron beamlines to separate and protect the ultra-high vacuum of the storage ring from the experimental environment. Currently, such a window is typically made of a thin, high-purity, beryllium foil, which may or may not have been polished. It is well known that these windows affect the transmitted beam quality. The impact ranges from non-perceptible to profound, depending on the experiment. The degradation of the X-ray beam is of increasing importance and concern, however, and in fact a number of beamlines now are run windowless or with a very small and thin silicon nitride window. There remain many instances where a large and robust window is desirable or necessary, and it is for this reason that developing windows that have little or no impact on the transmitted X-ray beam quality is important. This presentation reports on the progress in developing single-crystal beryllium X-ray windows. Due to its high purity and homogeneity, relative structural perfection, and high polishiblity single-crystal beryllium is an attractive window material candidate, particularly for beamlines conducting imaging or coherence-based experiments. Development of thin and uniform windows with less than 1 nm rms surface roughness and their preliminary characterization results are presented.

Citation Download Citation

Ali Khounsary, Barry Lai, Jun Qian, Ruben Khachatryan, Jozef Maj, and Xianrong Huang "Beam coherence and x-ray windows", Proc. SPIE 7802, Advances in X-Ray/EUV Optics and Components V, 78020O (6 October 2010); https://doi.org/10.1117/12.877449

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