Time-Resolved Thermal And Acoustic Pulse-Echo Measurements In Condensed Matter

Gary L. Eesley; Carolyn A. Paddock; Bruce M. Clemens

doi:10.1117/12.940888

22 April 1987 Time-Resolved Thermal And Acoustic Pulse-Echo Measurements In Condensed Matter

Gary L. Eesley, Carolyn A. Paddock, Bruce M. Clemens

Proceedings Volume 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices; (1987) https://doi.org/10.1117/12.940888
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States

Abstract

An optical transient reflectance technique has been developed to characterize both the thermal and elastic properties of thin film materials. By using picosecond duration laser pulses, films on the order of 100 nm thick can be studied. Measurements of the thermal diffusivity, interfacial thermal impedance and acoustic velocity in thin, supported metal films are discussed.

Citation Download Citation

Gary L. Eesley, Carolyn A. Paddock, and Bruce M. Clemens "Time-Resolved Thermal And Acoustic Pulse-Echo Measurements In Condensed Matter", Proc. SPIE 0794, Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices, (22 April 1987); https://doi.org/10.1117/12.940888

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