Numerical analyses of all-optical gate switches using cascaded second-order nonlinear effect in periodically poled lithium niobate devices: effects of device fabrication errors

Yutaka Fukuchi; Shun Tasaki

doi:10.1117/12.888911

7 January 2011 Numerical analyses of all-optical gate switches using cascaded second-order nonlinear effect in periodically poled lithium niobate devices: effects of device fabrication errors

Yutaka Fukuchi, Shun Tasaki

Author Affiliations +

Proceedings Volume 7987, Optoelectronic Materials and Devices V; 79870R (2011) https://doi.org/10.1117/12.888911
Event: Asia Communications and Photonics Conference and Exhibition, 2010, Shanghai, Shanghai, China

Abstract

We numerically calculate the switching performance of all-optical ultra-fast gate switches employing the cascade of second harmonic generation and difference frequency mixing in periodically poled lithium niobate devices. In the analyses, the device fabrication errors are considered. We show that the domain length error decreases the switching efficiency significantly.

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Yutaka Fukuchi and Shun Tasaki "Numerical analyses of all-optical gate switches using cascaded second-order nonlinear effect in periodically poled lithium niobate devices: effects of device fabrication errors", Proc. SPIE 7987, Optoelectronic Materials and Devices V, 79870R (7 January 2011); https://doi.org/10.1117/12.888911

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