Paper
23 November 2011 On-line defects inspection of floating glass by variable LED raster
Wenyong Yu
Author Affiliations +
Proceedings Volume 8006, MIPPR 2011: Remote Sensing Image Processing, Geographic Information Systems, and Other Applications; 800625 (2011) https://doi.org/10.1117/12.901870
Event: Seventh International Symposium on Multispectral Image Processing and Pattern Recognition (MIPPR2011), 2011, Guilin, China
Abstract
Purpose: To detect and identify all kinds of visible defection on floating glass production line in real time, such as bubbles, tin ash, impurities, stone, craterlet, thread, distortion, etc., which is extremely important for glass process management, grading and stowing. Methods: A set of machine vision system is used to detect the defects. In this system, a novel illumination technique and sensor unit based on time-variale LED raster is developed to obtain both the distortion and deformation features together. The resulting defects are determined by a RLE-based image processing algorithm and transferred to subsequent marking or cutting devices. Results: Real experiments illustrated the stability and effectiveness of this system, by which most of the main defects are inspected at real time under the speed of 30 m/min. With 5 m glass width, the inspection precisions are 0.1 mm/pixel both in direction of width and length. Applications verify the speed, reliability and accuracy of the proposed method. Conclusions: Quality inspection of floating glass at real time requires multiple linear cameras to construct distributed data processing system. Also material characters of the glass should be stressed to design proper optical structure, so that the glass defects will be inspected successfully. Using this system, the quality of floating glass can be improved effectively.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wenyong Yu "On-line defects inspection of floating glass by variable LED raster", Proc. SPIE 8006, MIPPR 2011: Remote Sensing Image Processing, Geographic Information Systems, and Other Applications, 800625 (23 November 2011); https://doi.org/10.1117/12.901870
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KEYWORDS
Glasses

Inspection

Image processing

Cameras

Computing systems

Light emitting diodes

Defect inspection

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