Polarimetry-based far-field method for high-resolution optical microscopy

Oscar G. Rodríguez-Herrera; David Lara; Chris Dainty

doi:10.1117/12.902119

21 October 2011 Polarimetry-based far-field method for high-resolution optical microscopy

Oscar G. Rodríguez-Herrera, David Lara, Chris Dainty

Proceedings Volume 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World; 80110V (2011) https://doi.org/10.1117/12.902119
Event: International Commission for Optics (ICO 22), 2011, Puebla, Mexico

Abstract

We present a polarimetry-based far-field method for high-resolution optical microscopy. The method is based on the measurement of scattering-angle-resolved polarization state distributions across the exit pupil of a high numerical aperture objective lens and allows us to distinguish between different sub-resolution objects with no need for an active scanning. Our numerical and experimental results show that the scattering-angle-resolved polarization state distributions can be used in the characterization of particles and structures with features below or at the edge of the Rayleigh resolution limit.

Citation Download Citation

Oscar G. Rodríguez-Herrera, David Lara, and Chris Dainty "Polarimetry-based far-field method for high-resolution optical microscopy", Proc. SPIE 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World, 80110V (21 October 2011); https://doi.org/10.1117/12.902119

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