A compact, fast, wide-field imaging spectrometer system

Pantazis Mouroulis; Byron E. Van Gorp; Victor E. White; Jason M. Mumolo; Daniel Hebert; Martin Feldman

doi:10.1117/12.882706

12 May 2011 A compact, fast, wide-field imaging spectrometer system

Pantazis Mouroulis, Byron E. Van Gorp, Victor E. White, Jason M. Mumolo, Daniel Hebert, Martin Feldman

Proceedings Volume 8032, Next-Generation Spectroscopic Technologies IV; 80320U (2011) https://doi.org/10.1117/12.882706
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

We present test results from a compact, fast (F/1.4) imaging spectrometer system with a 33° field of view, operating in the 450-1650 nm wavelength region with an extended response InGaAs detector array. The system incorporates a simple two-mirror telescope and a steeply concave bilinear groove diffraction grating made with gray scale x-ray lithography techniques. High degree of spectral and spatial uniformity (97%) is achieved.

Citation Download Citation

Pantazis Mouroulis, Byron E. Van Gorp, Victor E. White, Jason M. Mumolo, Daniel Hebert, and Martin Feldman "A compact, fast, wide-field imaging spectrometer system", Proc. SPIE 8032, Next-Generation Spectroscopic Technologies IV, 80320U (12 May 2011); https://doi.org/10.1117/12.882706

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available