Extremely lightweight x-ray optics based on thin substrates

R. Hudec; J. Sik; M. Lorenc; L. Pina; V. Marsikova; M. Mika; A. Inneman; M. Skulinova

doi:10.1117/12.890516

24 May 2011 Extremely lightweight x-ray optics based on thin substrates

R. Hudec, J. Sik, M. Lorenc, L. Pina, V. Marsikova, M. Mika, A. Inneman, M. Skulinova

Proceedings Volume 8076, EUV and X-Ray Optics: Synergy between Laboratory and Space II; 807604 (2011) https://doi.org/10.1117/12.890516
Event: SPIE Optics + Optoelectronics, 2011, Prague, Czech Republic

Abstract

We report on recent progress with development of astronomical X-ray optics based on bent Si wafers. Recent efforts with Si wafers have been focused on new forming technologies such as method of deposition of thin layers. The role of substrates quality in performance of final mirror arrays, as required by large future space X-ray astronomy experiments was also studied.

Citation Download Citation

R. Hudec, J. Sik, M. Lorenc, L. Pina, V. Marsikova, M. Mika, A. Inneman, and M. Skulinova "Extremely lightweight x-ray optics based on thin substrates", Proc. SPIE 8076, EUV and X-Ray Optics: Synergy between Laboratory and Space II, 807604 (24 May 2011); https://doi.org/10.1117/12.890516

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