Paper
10 February 2012 Simultaneous quantitative depth mapping and extended depth of field for 4D microscopy through PSF engineering
Author Affiliations +
Abstract
An extended depth of field (EDF) microscope that allows for quantitative axial positioning has been constructed. Past work has shown that EDF microscopy allows for features in varying planes to appear sharply focused simultaneously, however an inherent consequence of this is that depth information is lost. Here, a specifically engineered phase plate is used to create a point spread function (PSF) that contains both of the necessary attributes for extended depth of field and quantitative depth mapping. A two-camera solution is used to separate and capture the information for individualized post processing. The result is a microscope that can serve as an essential tool for full 3D, real-time imaging.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ramzi N. Zahreddine, Robert H. Cormack, and Carol J. Cogswell "Simultaneous quantitative depth mapping and extended depth of field for 4D microscopy through PSF engineering", Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 822705 (10 February 2012); https://doi.org/10.1117/12.909273
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Point spread functions

Image processing

Focus stacking

Microscopes

Microscopy

Nonlinear filtering

Ranging

RELATED CONTENT


Back to Top