Research on the pattern evaluation in the digital speckle pattern interferometry

Yonghong Wang; Nan Li; Hualong Zhou; Jianfei Sun; Lianxiang Yang

doi:10.1117/12.905196

15 November 2011 Research on the pattern evaluation in the digital speckle pattern interferometry

Yonghong Wang, Nan Li, Hualong Zhou, Jianfei Sun, Lianxiang Yang

Proceedings Volume 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation; 83212W (2011) https://doi.org/10.1117/12.905196
Event: Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 2011, Yunnan, China

Abstract

Digital Speckle Pattern Interferometry (DSPI) is one of modern optical measurement techniques. It has the advantage of non-contacting, whole field, high measurement accuracy and without special process of the surface to be measured. With the development of computer science and electronics, DSPI is used more and more widely. This paper systematically presents the principle of speckles and measurements by DSPI. Optical measurement system based on DSPI was built for demonstrate. In order to quantitative determination of the distribution of phase change, several imaging process and pattern evaluation methods are discussed and compared. Phase shifting techniques and phase pattern filter methods also were described in detail. In this paper, some experiments results were given, which clearly demonstrate that that the methods are effective for processing pattern.

Citation Download Citation

Yonghong Wang, Nan Li, Hualong Zhou, Jianfei Sun, and Lianxiang Yang "Research on the pattern evaluation in the digital speckle pattern interferometry", Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212W (15 November 2011); https://doi.org/10.1117/12.905196

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