Paper
14 May 2012 Image processing with Maple for simplified analysis in scanning microscopy
Alejandro Mesa
Author Affiliations +
Abstract
The images provided by a scanning microscopes show diffraction patterns product of the scanning mechanism. Those are complicated to analyze without computational help, I tried to find a simple way to make it easier, applying an automatic method. I have used some of the tools included in the image processing toolbox of Maple to analyze patterns which are commonly found in the images provided by the scanning microscopes, to make interpretation easier for the ones that want to analyze the image. I consider that, for how simple and opened it is, the method I developed may be useful for the people interested in the applications and further research related to analyzing scanning microscope images.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alejandro Mesa "Image processing with Maple for simplified analysis in scanning microscopy", Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 83780N (14 May 2012); https://doi.org/10.1117/12.918415
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KEYWORDS
Image processing

Image analysis

Scanning electron microscopy

Semiconductors

Data storage

Atomic force microscopy

Microscopy

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