Improved color interpolation method based on Bayer image

Jin Wang

doi:10.1117/12.974306

15 October 2012 Improved color interpolation method based on Bayer image

Jin Wang

Proceedings Volume 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing; 84200Z (2012) https://doi.org/10.1117/12.974306
Event: 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT 2012), 2012, Xiamen, China

Abstract

Image sensors are important components of lunar exploration device. Considering volume and cost, image sensors generally adopt a single CCD or CMOS at the present time, and the surface of the sensor is covered with a layer of color filter array(CFA), which is usually Bayer CFA. In the Bayer CFA, each pixel can only get one of tricolor, so it is necessary to carry out color interpolation in order to get the full color image. An improved Bayer image interpolation method is presented, which is novel, practical, and also easy to be realized. The results of experiments to prove the effect of the interpolation are shown. Comparing with classic methods, this method can find edge of image more accurately, reduce the saw tooth phenomenon in the edge area, and keep the image smooth in other area. This method is applied successfully in a certain exploration imaging system.

Citation Download Citation

Jin Wang "Improved color interpolation method based on Bayer image", Proc. SPIE 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing, 84200Z (15 October 2012); https://doi.org/10.1117/12.974306

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