Microroughness measurements and EUV calibration of the solar ultraviolet imager multilayer-coated mirrors

Dennis Martínez-Galarce; Regina Soufli; David L. Windt; Marilyn Bruner; Eric Gullikson; Shayna Khatri; Eberhard Spiller; Jeff Robinson; Sherry Baker; Evan Prast

doi:10.1117/12.953571

15 October 2012 Microroughness measurements and EUV calibration of the solar ultraviolet imager multilayer-coated mirrors

Dennis Martínez-Galarce, Regina Soufli, David L. Windt, Marilyn Bruner, Eric Gullikson, Shayna Khatri, Eberhard Spiller, Jeff Robinson, Sherry Baker, Evan Prast

Author Affiliations +

Proceedings Volume 8501, Advances in Metrology for X-Ray and EUV Optics IV; 85010I (2012) https://doi.org/10.1117/12.953571
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

The Solar Ultraviolet Imager (SUVI) is one of several instruments that will fly on board the next generation of Geostationary Operational Environmental Satellites (GOES) -R and -S platforms, as part of NOAA's space weather monitoring fleet. SUVI is a Generalized Cassegrain telescope that employs multilayer-coated optics that operate in six extreme ultraviolet (EUV) narrow bandpasses centered at 93.9, 131.2, 171.1, 195.1, 284.2 and 303.8 Å. Once operational, over the mission lifetime expected to last up to 10 years, SUVI will record full disk, EUV spectroheliograms every few minutes, where this data will be used to better understand the effects of solar produced EUV radiation on Earth and the near-Earth environment. The material presented herein will touch upon general aspects of the SUVI optical design, as well as the fabrication, super polishing and metrology of the fabricated mirrors, including measured EUV spectral performance.

Citation Download Citation

Dennis Martínez-Galarce, Regina Soufli, David L. Windt, Marilyn Bruner, Eric Gullikson, Shayna Khatri, Eberhard Spiller, Jeff Robinson, Sherry Baker, and Evan Prast "Microroughness measurements and EUV calibration of the solar ultraviolet imager multilayer-coated mirrors", Proc. SPIE 8501, Advances in Metrology for X-Ray and EUV Optics IV, 85010I (15 October 2012); https://doi.org/10.1117/12.953571

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