Development of grating-based hard x-ray Talbot interferometry for optics and beam wavefront characterization at the advanced photon source

Shashidhara Marathe; Michael J. Wojcik; Naresh G. Kujala; Albert T. Macrander; Han H. Wen; Chian Liu; Kamel Fezzaa; Ralu Divan; Derrick C. Mancini; Lahsen Assoufid

doi:10.1117/12.974896

15 October 2012 Development of grating-based hard x-ray Talbot interferometry for optics and beam wavefront characterization at the advanced photon source

Shashidhara Marathe, Michael J. Wojcik, Naresh G. Kujala, Albert T. Macrander, Han H. Wen, Chian Liu, Kamel Fezzaa, Ralu Divan, Derrick C. Mancini, Lahsen Assoufid

Author Affiliations +

Proceedings Volume 8501, Advances in Metrology for X-Ray and EUV Optics IV; 85010J (2012) https://doi.org/10.1117/12.974896
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

Here we report on the effort to develop a hard x-ray grating interferometry technique for application to hard x-ray optics and wavefront characterization at the Advanced Photon Source (APS), Argonne National Laboratory, USA. We will mention the motivation for developing an x-ray interferometer at the APS and discuss the design of the interferometer. We will also describe the efforts in fabricating 2-D gratings and a new type of grating having nanometer periods for high-energy x-ray applications. The preliminary results obtained using x-ray Talbot interferometers built at APS, using a broadband (pink) beam and a monochromatic beam demonstrate the importance of this tool as a metrology instrument for optics and beam wavefront diagnostics.

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Shashidhara Marathe, Michael J. Wojcik, Naresh G. Kujala, Albert T. Macrander, Han H. Wen, Chian Liu, Kamel Fezzaa, Ralu Divan, Derrick C. Mancini, and Lahsen Assoufid "Development of grating-based hard x-ray Talbot interferometry for optics and beam wavefront characterization at the advanced photon source", Proc. SPIE 8501, Advances in Metrology for X-Ray and EUV Optics IV, 85010J (15 October 2012); https://doi.org/10.1117/12.974896

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