Background filtering for accuracy improvement in computed tomography with iterative region-of-interest reconstruction

Keisuke Yamakawa; Shinichi Kojima

doi:10.1117/12.2007244

6 March 2013 Background filtering for accuracy improvement in computed tomography with iterative region-of-interest reconstruction

Keisuke Yamakawa, Shinichi Kojima

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Proceedings Volume 8668, Medical Imaging 2013: Physics of Medical Imaging; 86683F (2013) https://doi.org/10.1117/12.2007244
Event: SPIE Medical Imaging, 2013, Lake Buena Vista (Orlando Area), Florida, United States

Abstract

Two methods for preventing the deterioration of the accuracy of iterative region-of-interest (ROI) reconstruction are proposed. Both methods apply filters; the first one applies them to the whole region the outside the region of interest (outside ROI) without distinguishing objects (“method 1”, hereafter); and the second one applies them to only the air and patient-table regions while masking other objects outside the ROI (“method 2”). The effectiveness of both methods was evaluated in terms of simulated CT values by using two different phantoms. Method 1 reduced the artifact intensity level by 86% (at most) compared with that obtained with the conventional method. In the case of an object with high attenuation coefficient, method 2 decreases the level more than method 1. In other words, method 2 improves reconstruction accuracy without causing deterioration by the filters. By selecting either method 1 or 2 in accordance with the attenuation coefficient in regions of objects to be imaged, it is possible to reduce the error level compared with the conventional method.

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Keisuke Yamakawa and Shinichi Kojima "Background filtering for accuracy improvement in computed tomography with iterative region-of-interest reconstruction", Proc. SPIE 8668, Medical Imaging 2013: Physics of Medical Imaging, 86683F (6 March 2013); https://doi.org/10.1117/12.2007244

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KEYWORDS

Image filtering

Signal attenuation

Computed tomography

X-ray computed tomography

Data acquisition

X-rays

Sensors

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