Paper
17 April 2013 Forward light scattering method for structural characterization of electrospun fibers
Wei-Chih Wang, Chao-Shih Liu, Zhi-Rong You, Jin-Jia Hu
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Abstract
Electrospun fibers have been applied in numerous areas. In many of the applications, aligned fibers are desired for their specific properties. Recently, many different techniques have been developed to create aligned electrospun fibers. The direction of the fibers as well as the distribution of fiber orientations, in general, are analyzed by SEM which requires significant processing, thus increases time, and therefore costs. Currently we are examining these materials with forward light scattering in order to obtain fiber alignment and the distribution of fiber orientations. The proposed technique is slightly modified in the hardware and software from previous small angle scattering techniques to provide a more accurate and detailed mapping of the fibrous structure.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei-Chih Wang, Chao-Shih Liu, Zhi-Rong You, and Jin-Jia Hu "Forward light scattering method for structural characterization of electrospun fibers", Proc. SPIE 8695, Health Monitoring of Structural and Biological Systems 2013, 869523 (17 April 2013); https://doi.org/10.1117/12.2010107
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Cited by 2 scholarly publications.
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KEYWORDS
Light scattering

Image enhancement

Optical fibers

Scattering

Nanofibers

Laser scattering

Optical filters

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