A method to identify material based on spectrum analyses

L. Zhang; J. M. Dai; Y. F. Zhang; W. D. Pan; Z. Yin

doi:10.1117/12.2015042

31 January 2013 A method to identify material based on spectrum analyses

L. Zhang, J. M. Dai, Y. F. Zhang, W. D. Pan, Z. Yin

Proceedings Volume 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation; 87590C (2013) https://doi.org/10.1117/12.2015042
Event: International Symposium on Precision Engineering Measurement and Instrumentation 2012, 2012, Chengdu, China

Abstract

According to radiation temperature measurement theory, the key of temperature measurement is to choose the appropriate temperature model, which depends on the type of measured material. So how to identify the material type is significant to measure its surface temperature. Different materials have different spectral characters at the same temperature. In this paper, a method based on spectrum analysis is proposed to identify material. The spectrum of four kinds of materials is measured using Fourier transform infrared spectrometer (FTIR) at the same temperature 873K. The peak values extracted from each spectrum are used to train the identification algorithm. Then one material is chosen from the measured materials to verify the identification algorithm if the type of material can be identified. The experimental results suggest that the new method based on spectrum analyses can accurately identify the type of material.

Citation Download Citation

L. Zhang, J. M. Dai, Y. F. Zhang, W. D. Pan, and Z. Yin "A method to identify material based on spectrum analyses", Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87590C (31 January 2013); https://doi.org/10.1117/12.2015042

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