Paper
31 January 2013 3D measurement based on phase-shift and self-calibration
Liangzhou Chen, Yongjie Xu, Dan Xiao
Author Affiliations +
Proceedings Volume 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation; 87591A (2013) https://doi.org/10.1117/12.2014579
Event: International Symposium on Precision Engineering Measurement and Instrumentation 2012, 2012, Chengdu, China
Abstract
Non-contact three-dimension (3D) measurement technology has developed rapidly. Digital grating projection is regarded as the best prospect one. There are many problems, such as low accuracy, which have not been solved yet. Based on digital grating phase-shift, and combed with height-phase mapping and self lattice calibrating, a new 3D measurement method has been proposed. With little geometric constraints to digital grating and CCD, the measurement system is more feasible, which can be used to realize the accurate measurement and reconstruction according to the 3D information from measured object. By applying the method proposed to a reference object, the experience has lead to good result which shows that the new method is efficient and precision.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Liangzhou Chen, Yongjie Xu, and Dan Xiao "3D measurement based on phase-shift and self-calibration", Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87591A (31 January 2013); https://doi.org/10.1117/12.2014579
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KEYWORDS
3D metrology

Calibration

Phase measurement

Charge-coupled devices

3D modeling

Modulation

Associative arrays

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