Near infrared tunable diode laser absorption spectroscopy for ethylene concentration analysis

W. D. Pan; J. M. Dai; Y. F. Zhang; L. Zhang

doi:10.1117/12.2014631

31 January 2013 Near infrared tunable diode laser absorption spectroscopy for ethylene concentration analysis

W. D. Pan, J. M. Dai, Y. F. Zhang, L. Zhang

Proceedings Volume 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation; 87593R (2013) https://doi.org/10.1117/12.2014631
Event: International Symposium on Precision Engineering Measurement and Instrumentation 2012, 2012, Chengdu, China

Abstract

The absorption spectra of ethylene (C₂H₄) located at v5+v9 band near 1626nm involve some strong peaks that are suitable for trace gas concentration detection. They are interference free from other abundant molecules that are normally present in the atmosphere. An ethylene analysis system has been developed based on the tunable diode laser absorption spectroscopy. The high resolution transmission of ethylene near 1626nm has been measured by this system under different concentration. The severe overlapping between neighboring spectral lines of ethylene is observed and they cannot be separated with each other easily under atmospheric pressure and room temperature, so a multi-peaks spectrum recognition method is proposed to separate the ethylene spectrum from other interference gas while the ethylene concentration is ultra low. A mixture of high concentration methane, low concentration ethylene with air is used to evaluate the recognition efficiency. The result shows that the ethylene line can be abstract from strong background interference using multi-peaks spectrum recognition method and the accuracy of concentration measurement can reach about 5% comparing with a mass flow meter.

Citation Download Citation

W. D. Pan, J. M. Dai, Y. F. Zhang, and L. Zhang "Near infrared tunable diode laser absorption spectroscopy for ethylene concentration analysis", Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87593R (31 January 2013); https://doi.org/10.1117/12.2014631

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