Paper
17 May 2013 Optical properties of copper oxide thin films as selective sensing principle for hydrogen sulfide detection
Janosch Kneer, Manuel Boxberg, Jürgen Wöllenstein
Author Affiliations +
Proceedings Volume 8763, Smart Sensors, Actuators, and MEMS VI; 87630E (2013) https://doi.org/10.1117/12.2017330
Event: SPIE Microtechnologies, 2013, Grenoble, France
Abstract
Semiconducting cuprous (Cu2O) and cupric oxide (CuO) have been subject to intense research efforts, mainly because of the materials' potential for photovoltaic applications and as doping material. In this work, the impact of hydrogen sulfide (H2S) exposure on thin film samples of CuO and Cu2O has been investigated, focusing on alterations in the optical properties. The materials composition was verified using Raman spectroscopy. The samples were exposed to well-defined dosages of H2S and the transmission and reflection characteristics in the expanded UV/Vis regime (350-1100 nm) were recorded. Cu2O films showed an explicit increase in transmissivity for the wavelength region l = 550-900 nm, besides a general decrease in reflectivity of all samples within the considered spectral range. Optical band gaps were determined using Tauc's plotting, revealing a shift in the slope of a2 of CuO after gas exposure. The observed effects can be exploited as sensing effect, which was examined in a thin film total-internal-reflection (TIR) set-up to transiently monitor surface-gas interactions, yielding reproducible changes in response to 20 min exposure to5 ppm H2S.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Janosch Kneer, Manuel Boxberg, and Jürgen Wöllenstein "Optical properties of copper oxide thin films as selective sensing principle for hydrogen sulfide detection", Proc. SPIE 8763, Smart Sensors, Actuators, and MEMS VI, 87630E (17 May 2013); https://doi.org/10.1117/12.2017330
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KEYWORDS
Thin films

Copper

Oxides

Optical properties

Raman spectroscopy

Reflection

Reflectivity

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