Ultra-high resolution Fourier domain optical coherence tomography for resolving thin layers in painted works of art

C. S. Cheung; Haida Liang

doi:10.1117/12.2020765

30 May 2013 Ultra-high resolution Fourier domain optical coherence tomography for resolving thin layers in painted works of art

C. S. Cheung, Haida Liang

Author Affiliations +

Proceedings Volume 8790, Optics for Arts, Architecture, and Archaeology IV; 87900M (2013) https://doi.org/10.1117/12.2020765
Event: SPIE Optical Metrology 2013, 2013, Munich, Germany

Abstract

While OCT has been applied to the non-invasive examination of the stratigraphy of paint layers in recent years, it has been recognized that the resolutions of commercially available OCT cannot compete in depth resolution with conventional microscopic examination of cross-sections of paint samples. It is necessary to achieve resolutions better than 3 microns to resolve the thinnest layers of paint and varnish. In this paper, we demonstrate a Fourier domain ultrahigh resolution OCT at 810nm with depth resolution of 1.8 μm in air (or 1.2μm in varnish or paint).

Citation Download Citation

C. S. Cheung and Haida Liang "Ultra-high resolution Fourier domain optical coherence tomography for resolving thin layers in painted works of art", Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 87900M (30 May 2013); https://doi.org/10.1117/12.2020765

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