Overview Of Current IR Analysis Capabilities And Problem Areas

David L. Shumaker; James T. Wood

doi:10.1117/12.944272

3 May 1988 Overview Of Current IR Analysis Capabilities And Problem Areas

David L. Shumaker, James T. Wood

Proceedings Volume 0890, Infrared Systems and Components II; (1988) https://doi.org/10.1117/12.944272
Event: 1988 Los Angeles Symposium: O-E/LASE '88, 1988, Los Angeles, CA, United States

Abstract

This paper describes in overview the current status of analytical models used to design, evaluate, and predict the performance of passive thermal imaging systems (TISs). The scope is limited to real-time imaging systems and does not consider such equipments as infrared search-track sets, line scanners, or narrow band laser augmented sensors. The purpose is to establish the current limits of our analytical capability, problems in our ability to analyze TIS equipment, and improvements that are required at this time.

Citation Download Citation

David L. Shumaker and James T. Wood "Overview Of Current IR Analysis Capabilities And Problem Areas", Proc. SPIE 0890, Infrared Systems and Components II, (3 May 1988); https://doi.org/10.1117/12.944272

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