Paper
28 March 2014 Novel fluorinated compounds that improve durability of antistick layer for quartz mold
Tsuneo Yamashita, Hisashi Mitsuhashi, Masamichi Morita, Shuso Iyoshi, Makoto Okada, Shinji Matsui
Author Affiliations +
Abstract
In recent years, the reduction in pattern size is driving the rapid adoption of nanoimprint lithography (NIL). Since nanoimprinting since is contact printing, a higher separation force might damage the master and/or the imprint tool, either of which degrades pattern quality. One of the biggest concerns in NIL utilization is the mold-release characteristic of the master and the resin. Although Optool DSXTM (DAIKIN Ind. Ltd.) is a de facto standard as mold release reagent, there is a problem with its UV-NIL durability. Accordingly, we focused on developing new fluorinated low molecular weight perfluorocompounds to enhance the mold-release characteristic of the resist. This paper reports that resists containing these fluroinated compounds offer improved durability as antistick layers for quartz molds subjected to repeated UV-NIL exposure.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tsuneo Yamashita, Hisashi Mitsuhashi, Masamichi Morita, Shuso Iyoshi, Makoto Okada, and Shinji Matsui "Novel fluorinated compounds that improve durability of antistick layer for quartz mold", Proc. SPIE 9049, Alternative Lithographic Technologies VI, 90491Q (28 March 2014); https://doi.org/10.1117/12.2044448
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Cited by 1 scholarly publication.
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KEYWORDS
Quartz

Nanoimprint lithography

Semiconducting wafers

Fluorine

Ultraviolet radiation

Printing

Rutherfordium

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